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Author: IEEE International Conference on Microelectronic Test Structures [ All ]

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  Title Copies
Icmts 2001: Proceedings of the 2001 International Conference on Microelectronic Test Structures, March 19-22, 2001, Kobe, Japan 
Year: 2001 
ISBN: 0780365119 
ISBN 13: 9780780365117 
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