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Used & Rental Textbooks
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Page 6 of 12
Title
Authors/Editors
Publisher
Type
Copies
Thermally Stable Polymers: Syntheses and Properties
Year
:
1980
ISBN
:
0824769694
ISBN 13
:
9780824769697
Call No
:
QD 382.H4 C37 1980
Patrick E. Cassidy
Marcel Dekker Inc
Books
1
Plastic Process Engineering
Year
:
1979
ISBN
:
0824767004
ISBN 13
:
9780824767006
Call No
:
TP 156.P6 T44
James L. Throne
Marcel Dekker Inc
Books
1
Introduction to Automata Theory, Languages and Computation (Addison-Wesley series in computer science)
Edition
:
1st
Year
:
1979
ISBN
:
020102988X
ISBN 13
:
9780201029888
Call No
:
QA 267. H56 1979
John E. Hopcroft
Jeffrey D. Ullman
Addison-Wesley Publishing Company
Books
1
Thin Film Processes
Year
:
1979
ISBN
:
0127282505
ISBN 13
:
9780127282503
Call No
:
TK 7871.15.F5T43 1979
John L. Vossen
Werner Kern
Academic Press
Books
1
Electrophotography and Development Physics (Springer Series in Electronics and Photonics)
Edition
:
1
Year
:
1988
ISBN
:
3540189025
ISBN 13
:
9783540189022
Call No
:
TR 1045.S34 1988
Lawrence B. Schein
Springer
Books
1
Tungsten: Sources, Metallurgy, Properties, and Applications
Edition
:
1
Year
:
1979
ISBN
:
0306311445
ISBN 13
:
9780306311444
Call No
:
TN 799.T9 Y53 1979
W. Yih
Springer
Books
1
1997 19th Annual Electrical Overstress/Electrostatic Discharge Symposium, Eos/Esd
Year
:
1998
ISBN
:
1878303791
ISBN 13
:
9781878303790
Call No
:
TK 7869.E38 1997
IEEE Electron Devices
IEEE
Books
1
Electrostatic Discharge and Electronic Equipment: A Practical Guide for Designing to Prevent Esd Problems (Selected Reprint Series)
Edition
:
1st
Year
:
1989
ISBN
:
0879422440
ISBN 13
:
9780879422448
Call No
:
TK 7870.B68 1989
Warren Boxleitner
IEEE
Books
1
1995 IEEE International Symposium on Electromagnetics (Emc
Year
:
1995
ISBN
:
0780325737
ISBN 13
:
9780780325739
Call No
:
TK 6553. I34 1995
IEEE
Books
1
Icmts 2001: Proceedings of the 2001 International Conference on Microelectronic Test Structures, March 19-22, 2001, Kobe, Japan
Year
:
2001
ISBN
:
0780365119
ISBN 13
:
9780780365117
Call No
:
TK 7874.I3233 2001
IEEE International Conference on Microelectronic Test Structures
IEEE
Books
1
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